In recent years, the field of functional materials has witnessed a remarkable surge in interest and advancement, in large part driven by the unprecedented capabilities offered by advanced electron microscopy techniques. From understanding atomic-scale structures to unraveling intricate materials properties, electron microscopy has become an indispensable tool for probing functional materials and their complex electronic, magnetic, optical, and thermal behaviors. This Physical Review Materials Special Collection, guest-edited by Joanne Etheridge (Monash University) and Yimei Zhu (Brookhaven National Laboratory), explores the latest insights gained through advanced electron microscopy, illuminating the fundamental mechanisms governing the behavior of materials with tailored functionalities. Through this synthesis of cutting-edge research findings and methodological innovations, we venture to the forefront of this interdisciplinary field, unveiling novel perspectives and paving the way for future breakthroughs in materials science and engineering.




















