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Changing the state of a memristive system with white noise
Phys. Rev. E 87, 042103 – Published 4 April, 2013
DOI: https://doi.org/10.1103/PhysRevE.87.042103
Abstract
Can we change the average state of a resistor by simply applying white noise? We show that the answer to this question is positive if the resistor has memory of its past dynamics (a memristive system). We also prove that, if the memory arises only from the charge flowing through the resistor—an ideal memristor—then the current flowing through such memristor cannot charge a capacitor connected in series and, therefore, cannot produce useful work. However, the memristive system may skew the charge probability density on the capacitor, an effect that can be measured experimentally.
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References (23)
- L. O. Chua, IEEE Trans. Circuit Theory 18, 507 (1971).
- L. O. Chua and S. M. Kang, Proc. IEEE 64, 209 (1976).
- Y. V. Pershin and M. Di Ventra, Adv. Phys. 60, 145 (2011).
- O. Kavehei, A. Iqbal, Y. Kim, K. Eshraghian, S. Al-Sarawi, and D. Abbott, Proc. Royal Soc. A: Math. Phys. Eng. Sci. 466, 2175 (2010).
- T. Prodromakis and C. Toumazou, in Electronics, Circuits, and Systems (ICECS), 2010 17th IEEE International Conference (IEEE, Piscataway, NJ, 2010), pp. 934–937.
- R. Waser and M. Aono, Nat. Mater. 6, 833 (2007).
- L. Brillouin, Phys. Rev. 78, 627 (1950).
- M. Di Ventra, Y. V. Pershin, and L. O. Chua, Proc. IEEE 97, 1717 (2009).
- M. Di Ventra, Y. V. Pershin, and L. O. Chua, Proc. IEEE 97, 1371 (2009).
- J. J. Yang, M. D. Pickett, X. Li, D. A. A. Ohlberg, D. R. Stewart, and R. S. Williams, Nat. Nanotechnol. 3, 429 (2008).
- Y. V. Pershin and M. Di Ventra, Phys. Rev. B 78, 113309 (2008).
- X. Wang, Y. Chen, H. Xi, H. Li, and D. Dimitrov, El. Dev. Lett. 30, 294 (2009).
- T. Driscoll, H.-T. Kim, B. G. Chae, M. Di Ventra, and D. N. Basov, Appl. Phys. Lett. 95, 043503 (2009).
- C. D. Wright, L. Wang, M. M. Aziz, J. A. V. Diosdado, and P. Ashwin, Physica Status Solidi (B) 249, 1978 (2012).
- M. Di Ventra and Y. V. Pershin, arXiv:1302.7063 (2013).
- A. Stotland and M. Di Ventra, Phys. Rev. E 85, 011116 (2012).
- R. E. Pino, H. Li, Y. Chen, M. Hu, and B. Liu, in Design Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE (ACM, New York, NY, 2012), pp. 585–590.
- S. Savelév, A. Alexandrov, A. Bratkovsky, and R. S. Williams, Nanotechnology 22, 254011 (2011).
- G. A. Patterson, P. I. Fierens, A. A. Garcia, and D. F. Grosz, Phys. Rev. E 87, 012128 (2013).
- N. G. Van Kampen, Stochastic Processes in Physics and Chemistry, 3rd ed. (North Holland, Amsterdam, 2007).
- N. Tao, Nature Nanotechnol. 1, 173 (2006).
- A. Sawa, Mat. Today 11, 28 (2008).
- R. Mannella, Int. J. Mod. Phys. C 13, 1177 (2002).