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Direct determination of the refractive index of natural multilayer systems

Shinya Yoshioka* and Shuichi Kinoshita

  • Graduate School of Frontier Biosciences, Osaka University, Osaka 565-0871, Japan

  • *syoshi@fbs.osaka-u.ac.jp
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Phys. Rev. E 83, 051917 – Published 18 May, 2011

DOI: https://doi.org/10.1103/PhysRevE.83.051917

Abstract

It is well known that the metal-like strong reflection observed in the elytra of some kinds of beetles is produced by multilayer thin-film interference. For the quantitative analyses of the structural colors in these elytra, it is necessary to know accurate values of the refractive indices of the materials that comprise the multilayer structure. However, index determination is not an easy task: The elytron surface is not flat but curved and usually contains many irregular bumps, which cause scattering loss. These structural characteristics prevent us from directly applying conventional optical techniques for index determination, such as ellipsometry, since these techniques require a perfectly specular surface. In this paper, we report a new experimental procedure that can directly determine the refractive indices of individual layers in natural multilayer systems. This procedure involves semi-frontal thin-sectioning of the sample and subsequent optical examinations using a microspectrophotometer. We demonstrate that the complex refractive index and its wavelength dependence can be successfully determined for one kind of beetle.

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      Phys. Rev. E 83, 051917– Published 18 May, 2011
      • Received 23 February 2011

      ©2011 American Physical Society

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