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Reply to “Comment on ‘Experimental proof of standard electrodynamics by measuring the self-force on a part of a current loop’ ”

G. Cavalleri* and E. Tonni

  • Dipartimento di Matematica e Fisica, Università Cattolica del Sacro Cuore, Via Trieste 17, 25121 Brescia, Italy

  • *Electronic address: g.cavalleri@dmf.bs.unicatt.it

Phys. Rev. E 62, 7545 – Published 1 November, 2000

DOI: https://doi.org/10.1103/PhysRevE.62.7545

Abstract

Our paper [Phys. Rev. E 58, 2505 (1998)] described experimental results that brought into agreement standard theory and experiment, in contrast to two previous experiments that claimed disagreement. The shape of our circuit was designed to improve knowledge of the electric flux lines. Such a shape required numerical calculations to predict the relevant force on the mobile part of the circuit.

Comments & Replies

Comment on “Experimental proof of standard electrodynamics by measuring the self-force on a part of a current loop”

A. K. T. Assis
Phys. Rev. E 62, 7544 (2000)

Reply to “Electrodynamic force law controversy”

G. Cavalleri, E. Tonni, and G. Spavieri
Phys. Rev. E 63, 058602 (2001)

Electrodynamic force law controversy

Peter Graneau and Neal Graneau
Phys. Rev. E 63, 058601 (2001)

Original Article

Experimental proof of standard electrodynamics by measuring the self-force on a part of a current loop

G. Cavalleri, G. Bettoni, E. Tonni, and G. Spavieri
Phys. Rev. E 58, 2505 (1998)

References (7)

  1. G. Cavalleri, G. Bettoni, E. Tonni, and G. Spavieri, Phys. Rev. E 58, 2505 (1998).
  2. P. T. Pappas, Nuovo Cimento B 76, 189 (1983).
  3. T. E. Phipps and T. E. Phipps, Jr., Phys. Lett. A 146, 6 (1990); T. E. Phipps, Jr., in Proceedings of the Conference on Physical Interpretation of Relativity Theory, London, 1990, edited by M. C. Duffy (University of Sunderland, Sunderland, 1990), p. 435.
  4. G. Cavalleri, G. Spavieri, and G. Spinelli, Eur. J. Phys. 17, 205 (1996).
  5. P. G. Moyssides, IEEE Trans. Magn. 25, 4313 (1989).
  6. A. K. T. Assis, preceding Comment, Phys. Rev. E 62, 7544 (2000).
  7. A. K. T. Assis and M. A. Bueno, IEEE Trans. Magn. 32, 431 (1996).

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