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Phase-field models for anisotropic interfaces

G. B. McFadden, A. A. Wheeler, R. J. Braun, and S. R. Coriell

R. F. Sekerka

  • National Institute of Standards and Technology, Gaithersburg, Maryland 20899

  • Department of Physics, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213

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Phys. Rev. E 48, 2016 – Published 1 September, 1993

DOI: https://doi.org/10.1103/PhysRevE.48.2016

Abstract

The inclusion of anisotropic surface free energy and anisotropic linear interface kinetics in phase-field models is studied for the solidification of a pure material. The formulation is described for a two-dimensional system with a smooth crystal-melt interface and for a surface free energy that varies smoothly with orientation, in which case a quite general dependence of the surface free energy and kinetic coefficient on orientation can be treated; it is assumed that the anisotropy is mild enough that missing orientations do not occur. The method of matched asymptotic expansions is used to recover the appropriate anisotropic form of the Gibbs-Thomson equation in the sharp-interface limit in which the width of the diffuse interface is thin compared to its local radius of curvature. It is found that the surface free energy and the thickness of the diffuse interface have the same anisotropy, whereas the kinetic coefficient has an anisotropy characterized by the product of the interface thickness with the intrinsic mobility of the phase field.

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Phys. Rev. E 48, 2016– Published 1 September, 1993
  • Received 23 February 1993

© 1993 American Physical Society

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