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  • Access by Xinjiang University

A low-wave-vector expansion for reflectivity

B. L. Carvalho

S. H. Chen

  • Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139

  • Department of Nuclear Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139

Phys. Rev. E 47, 743 – Published 1 January, 1993

DOI: https://doi.org/10.1103/PhysRevE.47.743

Abstract

We expand an accurate, closed-form equation for the reflectivity in a power series around q2=0, where q2 is the z component of the wave-vector transfer in a film of constant composition. We examine, in particular, the case where q2=0 at the critical edge. Such an example might be realized through a neutron-reflectivity experiment on a microemulsion that exhibits surface layering. We find the coefficients of this low-wave-vector expansion to be the moments of the scattering-length density profile. We demonstrate how the first moment of the profile can be obtained from an accurate reflectivity measurement.

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