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Extreme-ultraviolet optical response of atomically thin molybdenum disulfide

Giacomo Fiorentini1,*, Nicola Di Palo1,*, Giacomo Inzani1, Gian Luca Dolso1, Simone Bonetti1, Qiuyang Li2, Fang Liu2,3, Xiaoyang Zhu2, Angelo Giglia4,5 et al.

Nicola Mahne4,5, Luca Pasquali4,6,7, Marco D'Alessandro8, Mikhail Malakhov9, María Camarasa-Gómez10, Juan José Esteve-Paredes11, Juan José Palacios11, Rocío Borrego-Varillas12, Mauro Nisoli1,12, Antonio Picón13, Davide Sangalli14, and Matteo Lucchini1,12,†

  • *These authors contributed equally to this work
  • Contact author: matteo.lucchini@polimi.it

Phys. Rev. B 114, 185419 – Published 16 September, 2026

DOI: https://doi.org/10.1103/xbcw-n8sc

Abstract

We report multiangle reflectivity measurements in the extreme-ultraviolet (XUV) range for mono- and bilayer MoS2 on a Si3N4 substrate. Using a single-sheet 2D conductivity model, we extract the complex optical response of the MoS2 bilayer between 25 and 90 eV and derive an effective refractive index by introducing a thickness equal to the interlayer spacing. The MoS2 monolayer response is consistently reproduced either by halving the 2D conductivity or the effective thickness, indicating a robust scaling with layer number. Conversely from what was previously observed around the energy gap, the resulting optical constants display a broad resonance at the Mo N2,3 edge with no clear core-exciton peaks below the absorption edge despite the reduced dimensionality. First-principles calculations reproduce the experimental results and show that local-field (Hartree) effects dominate the XUV response, while screened-exchange (SEX) contributions remain weak and mainly induce spectral shifts. Our analysis demonstrates that excitonic effects play a minor role in the XUV optical response of atomically thin MoS2, highlighting key differences with respect to the visible and infrared regimes, and calling for a reassessment of the use of Mo-based transition metal dichalcogenides in attosecond spectroscopy and XUV excitonics.

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