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Materials characterization by synchrotron x-ray microprobes and nanoprobes

Lorenzo Mino, Elisa Borfecchia, Jaime Segura-Ruiz, Cinzia Giannini, Gema Martinez-Criado*, and Carlo Lamberti†

Lorenzo Mino

  • Department of Physics and Interdepartmental Centre NIS, University of Turin, via Giuria 1, 10125 Torino, Italy

Elisa Borfecchia

  • Department of Chemistry, Interdepartmental Centre for Crystallography CrisDi, and INSTM Reference Center, University of Turin, via Giuria 7, 10125 Torino, Italy and Haldor Topsøe A/S, Haldor Topsøes Allé 1, 2800 Kgs. Lyngby, Denmark

Jaime Segura-Ruiz

  • European Synchrotron Radiation Facility (ESRF), 71 Avenue des Martyrs, BP 220, 38043 Grenoble Cedex 9, France and Institut Laue-Langevin (ILL), 71 avenue des Martyrs, 38000 Grenoble, France

Cinzia Giannini

  • Institute of Crystallography, National Research Council (IC-CNR), via Amendola 122/O, 70126 Bari, Italy

Gema Martinez-Criado*

  • European Synchrotron Radiation Facility (ESRF), 71 Avenue des Martyrs, BP 220, 38043 Grenoble Cedex 9, France and Instituto de Ciencia de Materiales de Madrid (ICMM), Consejo Superior de Investigaciones Científicas (CSIC), Sor Juana Inés de la Cruz 3, 28049 Madrid, Spain

Carlo Lamberti†

  • Department of Physics and Interdepartmental Centre NIS, University of Turin, via Giuria 1, 10125 Torino, Italy, Department of Chemistry, Interdepartmental Centre for Crystallography CrisDi, and INSTM Reference Center, University of Turin, via Giuria 7, 10125 Torino, Italy, and The Smart Materials Research Center, Southern Federal University, Sladkova Street 174/28, 344090 Rostov-on-Don, Russia

  • *gema.martinez.criado@csic.es
  • †carlo.lamberti@unito.it
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Rev. Mod. Phys. 90, 025007 – Published 28 June, 2018

DOI: https://doi.org/10.1103/RevModPhys.90.025007

Abstract

In recent years synchrotron x-ray microprobes and nanoprobes have emerged as key characterization tools with a remarkable impact for different scientific fields including solid-state, applied, high-pressure, and nuclear physics, chemistry, catalysis, biology, and cultural heritage. This review provides a comparison of the different probes available for the space-resolved characterization of materials (i.e., photons, electrons, ions, neutrons) with particular emphasis on x rays. Subsequently, an overview of the optics employed to focus x rays and the most relevant characterization techniques using x rays (i.e., x-ray diffraction, wide-angle x-ray scattering, small-angle x-ray scattering, x-ray absorption spectroscopy, x-ray fluorescence, x-ray-excited optical luminescence, and photoelectron spectroscopy) is reported. Strategies suitable to minimize possible radiation damage induced by brilliant focused x-ray beams are briefly discussed. The general concepts are then exemplified by a selection of significant applications of x-ray microbeams and nanobeams to materials science. Finally, the future perspectives for the development of nanoprobe science at synchrotron sources and free-electron lasers are discussed.

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Rev. Mod. Phys. 90, 025007– Published 28 June, 2018
  • Received 17 March 2017
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