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Advances in atomic force microscopy

Franz J. Giessibl*

Franz J. Giessibl*

  • Experimentalphysik VI, Electronic Correlations and Magnetism, Institute of Physics, Augsburg University, D-86135 Augsburg, Germany

  • *Electronic address: Franz.Giessibl@physik.uni-augsburg.de
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Rev. Mod. Phys. 75, 949 – Published 29 July, 2003

DOI: https://doi.org/10.1103/RevModPhys.75.949

Abstract

This article reviews the progress of atomic force microscopy in ultrahigh vacuum, starting with its invention and covering most of the recent developments. Today, dynamic force microscopy allows us to image surfaces of conductors and insulators in vacuum with atomic resolution. The most widely used technique for atomic-resolution force microscopy in vacuum is frequency-modulation atomic force microscopy (FM-AFM). This technique, as well as other dynamic methods, is explained in detail in this article. In the last few years many groups have expanded the empirical knowledge and deepened our theoretical understanding of frequency-modulation atomic force microscopy. Consequently spatial resolution and ease of use have been increased dramatically. Vacuum atomic force microscopy opens up new classes of experiments, ranging from imaging of insulators with true atomic resolution to the measurement of forces between individual atoms.

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This article appears in the following collection:

Scanning Probe Microscopy: From Sublime to Ubiquitous

This collection marks the 35th anniversary of scanning tunneling microscopy (STM) and the 30th anniversary of atomic force microscopy (AFM). These papers, all published in the Physical Review journals, highlight the positive impact that STM and AFM have had, and continue to have, on physical science research. The papers included in the collection have been made free to read.

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Rev. Mod. Phys. 75, 949– Published 29 July, 2003

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