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Scanning tunneling microscopy—from birth to adolescence
Rev. Mod. Phys. 59, 615 – Published 1 July, 1987
DOI: https://doi.org/10.1103/RevModPhys.59.615
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Scanning Probe Microscopy: From Sublime to Ubiquitous
This collection marks the 35th anniversary of scanning tunneling microscopy (STM) and the 30th anniversary of atomic force microscopy (AFM). These papers, all published in the Physical Review journals, highlight the positive impact that STM and AFM have had, and continue to have, on physical science research. The papers included in the collection have been made free to read.
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