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Extended x-ray absorption fine structure—its strengths and limitations as a structural tool

P. A. Lee, P. H. Citrin, P. Eisenberger, and B. M. Kincaid

P. A. Lee, P. H. Citrin, P. Eisenberger, and B. M. Kincaid

  • Bell Laboratories, Murray Hill, New Jersey 07974

Rev. Mod. Phys. 53, 769 – Published 1 October, 1981

DOI: https://doi.org/10.1103/RevModPhys.53.769

Abstract

The authors review the development of extended x-ray absorption fine structure (EXAFS) within the last decade. Advances in experimental techniques have been largely stimulated by the availability of synchrotron radiation. The theory of EXAFS has also matured to the point where quantitative comparison with experiments can be made. The authors review in some detail the analysis of EXAFS data, starting from the treatment of raw data to the extraction of distances and amplitude information, and they also discuss selected examples of applications of EXAFS chosen to illustrate both the strength and limitations of EXAFS as a structural tool.

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