- Access by Xinjiang University
Dielectric Constant and Mobility of a Doped Zero-Gap Semiconductor
Phys. Rev. Lett. 23, 772 – Published 6 October, 1969Erratum Phys. Rev. Lett. 23, 1205 (1969)
DOI: https://doi.org/10.1103/PhysRevLett.23.772
Abstract
The concentration-dependent static dielectric constant is calculated for degenerate -type -Sn. The anomalous enhancement of the low-temperature and low-concentration electron mobility is explained.
Erratum
Dielectric Constant and Mobility of a Doped Zero-Gap Semiconductor.
Phys. Rev. Lett. 23, 1205 (1969)
References (10)
- L. Liu and D. Brust, Phys. Rev. Letters 20, 651 (1968) Phys. Rev. 173, 777 (1968)
- D. Sherrington and W. Kohn, Rev. Mod. Phys. 40, 767 (1968) B. I. Halperin and T. M. Rice, 40, 755 (1968)
- E. D. Hinkley and A. W. Ewald, Phys. Rev. 134, A126 (1964)
- O. N. Tufte and A. W. Ewald, Phys. Rev. 122, 1431 (1961)
- C. F. Lavine, thesis, Northwestern University (unpublished)
- P. Nozières and D. Pines, Nuovo Cimento 9, 470 (1958) Phys. Rev. 109, 762 (1958) H. Ehrenreich and M. H. Cohen, 115, 786 (1959)
- R. E. Lindquist and A. W. Ewald, Phys. Rev. 135, A191 (1964)
- R. B. Dingle, Phil. Mag. 46, 831 (1955)
- B. L. Booth and A. W. Ewald, Phys. Rev. Letters 18, 491 (1967)
- D. Sherrington and W. Kohn, Phys. Rev. Letters 21, 153 (1968)