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Conduction electron scattering and spin flipping at sputtered Co/Ni interfaces
Phys. Rev. B 82, 220401(R) – Published 13 December, 2010
DOI: https://doi.org/10.1103/PhysRevB.82.220401
Abstract
Current-perpendicular-to-plane magnetoresistance (CPP-MR) measurements let us quantify conduction electron scattering and spin flipping at a sputtered ferromagnetic/ferromagnetic interface, with important consequences for CPP-MR and spin-torque experiments with perpendicular anisotropy. We use ferromagnetically coupled multilayers, and Py-based, symmetric double exchange-biased spin valves containing inserts of ferromagnetically coupled or multilayers, to derive Co/Ni interface specific resistances and , and interface spin-flipping parameter . The specific resistances are consistent with our no-free-parameter calculations for an interface thickness between 2 and 4 monolayers that is compatible with expectations.
Article Text
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