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Magnetoresistance through a single nickel atom
Phys. Rev. B 66, 220401(R) – Published 12 December, 2002
DOI: https://doi.org/10.1103/PhysRevB.66.220401
Abstract
The magnetoresistance (MR) of a nickel atomic contact has been measured using the break junction technique. When the contact is only between two atoms, the change of resistance with applied field reaches 40%. It is composed of a continuous bell-shaped curve on which discrete jumps are superimposed. The MR changes sign when the applied field is rotated, which we explain by a spin-orbit coupling change of orbital overlap between the Ni atoms forming the junction. Reproducible jumps in the MR curve are attributed to a field induced change of spin configuration within the few atoms composing the contact.
References (19)
- I. A. Campbell and A. Fert, Ferromagnetic Materials, edited by E. P. Wohlfarth (North Holland, Amsterdam, 1982), Vol. 3.
- G.G. Cabrera and L.M. Falicov, Phys. Status Solidi B 61, 539 (1974).
- M. Viret, D. Vignoles, D. Cole, J.M.D. Coey, W. Allen, and J.F. Gregg, Phys. Rev. B 53, 8464 (1996).
- D.A. Wharam, T.J. Thornton, R. Newbury, M. Pepper, H. Ahmed, J.E.F. Frost, D. G Hasko, D.C. Peacock, D.A. Ritchie, and G.A.C. Jones, J. Phys. C 21, L209 (1998).
- J.C. Cuevas, A. Levy Yeyati, A. Martin-Rodero, G. Rubio Bolinga, C. Untiedt, and N. Agrait, Phys. Rev. Lett. 81, 2990 (1998); A. Martin-Rodero, A. Levy Yeyati, and J.C. Cuevas, Physica C 67, 352 (2001).
- E. Scheer, P. Joyez, D. Esteve, C. Urbina, and M.H. Devoret, Phys. Rev. Lett. 78, 3535 (1997).
- A. Smogunov, A. Dal Corso, and E. Tossatti, cond-mat/0111376 (unpublished).
- H. Oshima and K. Miyano, Appl. Phys. Lett. 73, 2203 (1998).
- T. Ono, H. Miyajim, and Y. Otani, Appl. Phys. Lett. 75, 1622 (1999).
- K. Nakanishi and Y.O. Nakamura, Phys. Rev. B 61, 11 278 (2000).
- P. Bruno, Phys. Rev. Lett. 83, 2425 (1999).
- D. Weinmann, R. L. Stamps, and R. A. Jalabert (unpublished).
- H. Imamura, N. Kobayashi, S. Takahashi, and S. Maekawa, Phys. Rev. Lett. 84, 1003 (2000).
- C. Sirvent, J.G. Rodrigo, S. Vieira, L. Jurczyszyn, N. Mingo, and F. Flores, Phys. Rev. B 53, 16 086 (1996).
- U. Ebels, A. Radulescu, Y. Henry, L. Piraux, and K. Ounadjela, Phys. Rev. Lett. 84, 983 (2000); J.E. Wegrowe, A. Comment, Y. Jaccard, J.P. Ansermet, N.M. Dempsey, and J.P. Nozieres, Phys. Rev. B 61, 12 216 (2000).
- S.J.C. Theeuwen, J. Caro, K.I. Schreurs, R.P. van Gorkom, K.P. Wellock, N.N. Gribov, S. Radelaar, R.M. Jungblut, W. Oepts, R. Coehoorn, and V.I. Kozub, J. Appl. Phys. 89, 4442 (2001).
- N. Garcia, M. Munoz, and Y.W. Zhao, Phys. Rev. Lett. 82, 2923 (1999); N. Garcia, M. Munoz, G.G. Qian, H. Rohrer, I.G. Saveliev, and Y.W. Zhao, Appl. Phys. Lett. 79, 4550 (2001).
- H.D. Chopra and S.Z. Hua, Phys. Rev. B 66, 020403 (2002).
- J.M. van Ruitenbeek, A. Alvarez, I. Pineyro, C. Grahmann, P. Joyez, M.H. Devoret, and D. Esteve, Rev. Sci. Instrum. 67, 108 (1996).