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  • Access by Xinjiang University

Role of the localized states in field emission of carbon nanotubes

Seungwu Han and Jisoon Ihm

  • Department of Physics and Center for Theoretical Physics, Seoul National University, Seoul 151-742, Korea

Phys. Rev. B 61, 9986 – Published 15 April, 2000

DOI: https://doi.org/10.1103/PhysRevB.61.9986

Abstract

We have performed ab initio pseudopotential electronic structure calculations for various edge geometries of the (n,n) single-wall nanotube with or without applied fields. Among the systems studied, the one with a zigzag edge exposed by a slant cut is found to be the most favorable for emission due to the existence of unpaired dangling bond states around the Fermi level. The next most favorable geometry is the capped nanotube where π-bonding states localized at the cap and pointing in the tube axis direction occur at the Fermi level. A scaling rule for the induced field linear in the aspect ratio of the tube is also obtained.

References (19)

  1. Y. Saito et al., Jpn. J. Appl. Phys., Part 2 36, L1340 (1997).
  2. J.-M. Bonard, J.-P. Salvetat, T. Stockli, and W. A. de Heer, Appl. Phys. Lett. 73, 918 (1998).
  3. A. G. Rinzler et al., Science 269, 1550 (1995).
  4. W. A. de Heer, A. Chatelain, and D. Ugarte, Science 270, 1179 (1995).
  5. Y. Saito et al., Appl. Phys. A: Mater. Sci. Process. 67, 95 (1998).
  6. Q. H. Wang, T. D. Corrigan, J. Y. Dai, and R. P. H. Chang, Appl. Phys. Lett. 70, 3308 (1997).
  7. P. G. Collins and A. Zettl, Appl. Phys. Lett. 69, 1969 (1996); Phys. Rev. B 55, 9391 (1997).
  8. Q. H. Wang, A. A. Setlur, J. M. Lauerhaas, J. Y. Dai, E. W. Seelig, and R. P. H. Chang, Appl. Phys. Lett. 72, 2912 (1998); Y. Saito, S. Uemura, and K. Hamaguchi, Jpn. J. Appl. Phys., Part 2 37, L346 (1998); W. B. Choi et al., Appl. Phys. Lett. 75, 3129 (1999).
  9. Z. F. Ren et al., Science 282, 1105 (1998).
  10. S. Fan et al., Science 283, 512 (1999).
  11. J. Ihm, A. Zunger, and M. L. Cohen, J. Phys. C 12, 4409 (1979).
  12. N. Troullier and J. L. Martins, Phys. Rev. B 43, 1993 (1991).
  13. O. F. Sankey and D. J. Niklewski, Phys. Rev. B 40, 3979 (1989).
  14. C. H. Xu, C. Z. Wang, C. T. Chan, and K. M. Ho, J. Phys.: Condens. Matter 4, 6047 (1992).
  15. D. L. Carroll et al., Phys. Rev. Lett. 78, 2811 (1997).
  16. P. Kim, T. W. Odom, J.-L. Huang, and C. M. Lieber, Phys. Rev. Lett. 82, 1225 (1999); R. Tamura and M. Tsukada, Phys. Rev. B 52, 6015 (1995).
  17. A. De Vita, J.-Ch. Charlier, X. Blase, and R. Car, Appl. Phys. A: Mater. Sci. Process. 68, 283 (1999).
  18. V. T. Binh, S. T. Purcell, N. Garcia, and J. Doglioni, Phys. Rev. Lett. 69, 2527 (1992); ibid.M. L. Yu, N. D. Lang, B. W. Hussey, T. H. P. Chang, and W. A. Mackie, 77, 1636 (1996).
  19. J. Charlier, A. De Vita, X. Blase, and R. Car, Science 275, 646 (1997).

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