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Epitaxial-strain-stabilized ordering in Au1xNix alloy thin films grown by MBE

G. Abadias*, I. Schuster, and A. Marty

B. Gilles

  • CEA-Grenoble, Département de Recherche Fondamentale sur la Matière Condensée, SP2M, 17 Avenue des Martyrs, 38054 Grenoble cedex 09, France

  • LTPCM-ENSEEG, Institut National Polytechnique de Grenoble, 38402 Saint Martin d’Hères cedex, France

  • *Present address: Laboratoire de Métallurgie Physique, Université de Poitiers, SP2MI, Téléport 2, bvd Marie et Pierre Curie, 86962 Futuroscope cedex, France. Electronic address: gregory.abadias@lmp.univ-poitiers.fr

Phys. Rev. B 61, 6495 – Published 1 March, 2000

DOI: https://doi.org/10.1103/PhysRevB.61.6495

Abstract

The influence of the epitaxial strain on the structural evolution with temperature of AuNi metastable alloys thin films is investigated. Samples with different initial configurations (codeposited Au1xNix solid solutions and artificially layered structures) were grown by molecular-beam epitaxy on different (001)-oriented buffer layers (Au, Pt, and Pd). The epitaxial strain was varied by changing (i) the Ni content of the AuNi layer for a given kind of buffer layer, (ii) the nature of the buffer layer for a fixed Ni content, and (iii) the AuNi layer thickness for a fixed Ni content and buffer layer. The structural evolution upon annealing in the 180–300 °C temperature range was studied by in situ temperature x-ray diffraction as well as high-resolution electron microscopy. It is shown that a modulated structure develops along the growth direction of the AuNi layer, when the temperature reaches 200–240 °C, provided that the residual strain is high enough (>2%). This structure consists of a periodic stacking of 1 Ni-rich plane and 2 or 3 Au-rich planes, depending on the Ni content. The results are explained in terms of a strain-stabilized ordering effect, as supported by energetic calculations based on semiempirical interatomic potentials within the tight-binding scheme.

References (57)

  1. G. A. Prinz, Phys. Rev. Lett. 54, 1051 (1985).
  2. Z. Q. Wang, S. H. Lu, Y. S. Li, F. Jona, and P. M. Marcus, Phys. Rev. B 35, 9322 (1987).
  3. A. Ourmazd and J. C. Bean, Phys. Rev. Lett. 55, 765 (1985).
  4. T. S. Kuan, T. F. Kuech, W. I. Wang, and E. L. Wilkie, Phys. Rev. Lett. 54, 201 (1985).
  5. D. Korakakis, K. F. Ludwig, and T. D. Moustakas, Appl. Phys. Lett. 71, 72 (1997).
  6. V. Pierron-Bohnes, N. Ringelstein, A. Michel, S. Boukari, L. Bouzidi, N. Persat, E. Beaurepaire, M. Hehn, D. Muller, and M. C. Cadeville, J. Magn. Magn. Mater. 165, 176 (1997).
  7. A. Marty, B. Gilles, G. Patrat, J. C. Joud, and A. Chamberod, in Evolution of Surface and Thin Film Microstructure, edited by H. A. Atwater et al., MRS Symposia Proceedings No. 280 (Materials Research Society, Pittsburgh, 1993), p. 457.
  8. M. J. Jou, Y. T. Cherng, H. R. Jen, and G. B. Stringfellow, Appl. Phys. Lett. 52, 549 (1987).
  9. G. L. Zhou, M. H. Yang, and C. P. Flynn, Phys. Rev. Lett. 77, 4580 (1996).
  10. C. P. Flynn, Phys. Rev. Lett. 57, 599 (1986).
  11. D. M. Wood and A. Zunger, Phys. Rev. B 40, 4062 (1989).
  12. H. Reichert, S. C. Moss, P. Imperatori, and K. Evans-Lutterodt, Appl. Phys. Lett. 74, 531 (1999).
  13. M. A. Herman and H. Sitter, in Molecular Beam Epitaxy: Fundamentals and Current Status, edited by M. B. Panish, Springer Series in Materials Science Vol. XII (Springer-Verlag, Berlin, 1996).
  14. J. L. Stevens and R. Q. Hwang, Phys. Rev. Lett. 74, 2078 (1995).
  15. L. Bouzidi, V. Pierron-Bohnes, O. Haemmerlé, C. Bouillet-Ulhaq, and M. C. Cadeville, Thin Solid Films 318, 215 (1998).
  16. H. Okamoto and T. B. Massalski, Binary Alloy Phase Diagrams (American Society for Metals, Metals Park, OH, 1986).
  17. E. C. Elwood and K. Q. Bagley, J. Inst. Met. 80, 617 (1952).
  18. B. Golding and S. C. Moss, Acta Metall. 15, 1239 (1967).
  19. G. Abadias, A. Marty, and B. Gilles, Acta Mater. 46, 6403 (1998).
  20. J. E. Woodilla and B. L. Averbach, Acta Metall. 16, 255 (1968).
  21. S. C. Moss, in Local Atomic Arrangements Studied by X-ray Diffraction, edited by J. B. Cohen and J. E. Hilliard (Gordon and Breach, New York, 1966), p. 95.
  22. H. Hofer and P. Warbichler, Z. Metallkd. 76, 11 (1985).
  23. J. W. Cahn, Trans. Soc. Min. Eng. AIME 242, 166 (1968); Acta Metall. 14, 1685 (1966).
  24. G. Renaud, M. Belakhovsky, S. Lefebvre, and M. Bessiere, J. Phys. III 5, 1391 (1995).
  25. C. Dressler, G. Abadias, P. Bayle-Guillemaud, A. Marty, I. Schuster, J. Thibault, and B. Gilles, Appl. Phys. Lett. 72, 2241 (1998).
  26. T. B. Wu and J. B. Cohen, Acta Metall. 31, 1929 (1983).
  27. T. B. Wu and J. B. Cohen, Acta Metall. 32, 861 (1984).
  28. J. Eymery, F. Lançon, and L. Billard, J. Phys. I 3, 787 (1993).
  29. C. Colinet, J. Eymery, A. Pasturel, A. T. Paxton, and M. van Schilfgaarde, J. Phys.: Condens. Matter 6, L47 (1994).
  30. C. Amador and G. Bozzolo, Phys. Rev. B 49, 956 (1994).
  31. T. Deutsch and A. Pasturel, in Stability of Materials, Vol. 355 of NATO Advanced Study Institute, Series B: Physics, edited by A. Gonis (Plenum, New York, 1996), p. 381.
  32. C. Wolverton and A. Zunger, Comput. Mater. Sci. 8, 107 (1997).
  33. V. Ozolins, C. Wolverton, and A. Zunger, Phys. Rev. B 57, 6427 (1998).
  34. C. Wolverton, V. Ozolins, and A. Zunger, Phys. Rev. B 57, 4332 (1998).
  35. R. R. Hultgren, P. D. Andersen, and K. K. Kelley, Selected Values of Thermodynamic Properties of Metals and Alloys (Wiley, New York, 1963).
  36. P. A. Flinn, B. L. Averbach, and M. Cohen, Acta Metall. 1, 664 (1953).
  37. T. Deutsch, P. Bayle, F. Lançon, and J. Thibault, J. Phys.: Condens. Matter 7, 6407 (1995).
  38. G. Abadias, T. Deutsch, A. Marty, and B. Gilles (unpublished).
  39. V. Ozolins, C. Wolverton, and A. Zunger, Phys. Rev. B 57, 4816 (1998).
  40. P. Alippi, P. M. Marcus, and M. Scheffler, Phys. Rev. Lett. 78, 3892 (1997).
  41. P. M. Marcus and P. Alippi, Phys. Rev. B 57, 1971 (1998).
  42. B. Gilles, A. Marty, G. Patrat, J. L. Vassent, J. C. Joud, and A. Chamberod, in Mechanisms of Thin Film Evolution, edited by S. M. Yalisove, C. V. Thompson, and D. J. Eaglesham, MRS Symposia Proceedings No. 317 (Materials Research Society, Pittsburgh, 1994), p. 621.
  43. P. Bayle, T. Deutsch, B. Gilles, F. Lançon, A. Marty, and J. Thibault, Ultramicroscopy 56, 94 (1994).
  44. The buffer layer was thick enough to be completely relaxed, as it was verified by x-ray diffraction measurements.
  45. M. Dynna, A. Marty, B. Gilles, and G. Patrat, Acta Mater. 44, 4417 (1996).
  46. D. Gibbs, B. M. Ocko, D. M. Zehner, and S. G. J. Mochrie, Phys. Rev. B 42, 7330 (1990).
  47. D. J. Bottomley, P. Fons, and D. J. Tweet, J. Cryst. Growth 154, 401 (1995).
  48. T. Sakamoto, H. Funabashi, K. Ohta, T. Nakagawa, N. J. Kawai, T. Kojima, and Y. Bando, Superlattices Microstruct. 1, 347 (1985).
  49. M. Dynna, A. Marty, B. Gilles, and G. Patrat, Acta Mater. 45, 257 (1997).
  50. P. Bayle-Guillemaud, C. Dressler, G. Abadias, and J. Thibault, Thin Solid Films 318, 209 (1998).
  51. G. Abadias, I. Schuster, B. Gilles, and A. Marty, Thin Solid Films 318, 204 (1998).
  52. G. Abadias, I. Schuster, B. Gilles, A. Marty, and T. Deutsch (unpublished).
  53. S. C. Moss and B. L. Averbach, in Proceedings of the Conference on Small Angle Scattering of X-rays, edited by H. Brumberger (Gordon and Breach, New York, 1967), p. 335.
  54. Y. Fukano, J. Phys. Soc. Jpn. 16, 1195 (1961).
  55. C. Dressler, P. Bayle-Guillemaud, and J. Thibault, Mater. Sci. Forum 294-296, 321 (1999).
  56. H. Fujita, H. Nakayama, and Y. Fuchida, Philos. Mag. A 59, 873 (1989).
  57. H. Fujita and C. Lu, Mater. Trans., JIM 33, 897 (1992).

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