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Interdiffusion process in lattice-matched InxGa1xAsyP1y/InP and GaAs/AlxGa1xAs quantum wells

Kohki Mukai, Mitsuru Sugawara, and Susumu Yamazaki

  • Fujitsu Laboratories Ltd., 10-1 Morinosato-Wakamiya, Atsugi 243-01, Japan

Phys. Rev. B 50, 2273 – Published 15 July, 1994

DOI: https://doi.org/10.1103/PhysRevB.50.2273

Abstract

We derive a formula that describes interdiffusion profiles of quantum wells and shows how the formula accurately models interdiffusion in quantum wells of lattice-matched InxGa1xAsyP1y and AlxGa1xAs alloy semiconductors. Our formula includes the different interdiffusion coefficients between layers and interfacial discontinuity of interdiffused species. Our formula explains how quantum energy shifts due to interdiffusion vary with annealing time and annealing temperature in various wide well layers of both InxGa1xAsyP1y/InP and GaAs/AlxGa1xAs quantum wells. We also show the quantitative difference between interdiffusion profiles of these two materials.

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