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Intrasubband scattering in highly excited semiconductor quantum wells with biaxial strain

Shunji Seki and Kiyoyuki Yokoyama

Paul Sotirelis

  • NTT Opto-Electronics Laboratories, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa 243-01, Japan

  • Beckman Institute, University of Illinois at Urbana-Champaign, 405 North Mathews Avenue, Urbana, Illinois 61801

Phys. Rev. B 50, 1663 – Published 15 July, 1994

DOI: https://doi.org/10.1103/PhysRevB.50.1663

Abstract

Intrasubband scattering rates are calculated for electrons and holes at finite temperatures in highly excited semiconductor strained-layer quantum-well structures. Carrier-carrier and carrier-phonon interactions are taken into account on an equal basis within the fully dynamic random-phase approximation for multisubband structures. It will be shown that the strain-induced changes in the valence-band structure exert a significant influence on the scattering rates of the electrons as well as the holes. The screening of carrier-phonon interaction by the electron-hole plasma in the coupled electron-hole-phonon system is discussed and analyzed.

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