Backscattering of electrons from multilayers

Maurizio Dapor

doi:10.1103/PhysRevB.48.3003

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Backscattering of electrons from multilayers

Maurizio Dapor

Istituto per la Ricerca Scientifica e Tecnologica, (I.R.S.T.), I-38050 Povo, Trento, Italy

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Phys. Rev. B 48, 3003 – Published 1 August, 1993

DOI: https://doi.org/10.1103/PhysRevB.48.3003

Abstract

The multiple reflection method of Schmidt [Ann. Phys. (Leipzig) 23, 671 (1907)] has been developed to study the general case of backscattering of electrons from multilayers. Exact expressions have been given for the absorption, backscattering, and transmission of electrons impinging on multilayers which reduce to previously deduced equations concerning supported and unsupported thin films.

References (5)

H.W. Schmidt, Ann. Phys. (Leipzig) 23, 671 (1907).
M. Dapor, Phys. Rev. B 43, 10118 (1991); ibid. 44, 9784 (1991).
M. Dapor, Surf. Sci. 269/270, 753 (1992).
M. Dapor, Phys. Rev. B 46, 618 (1992).
M. Dapor, Appl. Surf. Sci. 70/71, 327 (1993).

[c1] H.W. Schmidt, Ann. Phys. (Leipzig) 23, 671 (1907).

[c2] M. Dapor, Phys. Rev. B 43, 10118 (1991); ibid. 44, 9784 (1991).

[c3] M. Dapor, Surf. Sci. 269/270, 753 (1992).

[c4] M. Dapor, Phys. Rev. B 46, 618 (1992).

[c5] M. Dapor, Appl. Surf. Sci. 70/71, 327 (1993).

Physical Review B

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Backscattering of electrons from multilayers

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