- Access by Xinjiang University
Order-disorder phase transition in an amorphous GeSbTe compound
Phys. Rev. B 113, 064113 – Published 23 February, 2026
DOI: https://doi.org/10.1103/59f2-hwsd
Abstract
Conductance noise measurements on amorphous films of GeSbTe reveal a structural phase transition driven by temperature. Measurements are performed on samples that were first densified by multiple heat-treatment cycles. In the heavily densified regime, varying the film temperature changed the resistance in a systematic and reproducible way. Monitoring the conductance noise of the sample during temperature cycles, revealed a reversible process. The power spectrum and magnitude of the conductance-noise, measured over the 295–330 K temperature range, exhibited changes that are characteristics of a phase transition. The phases defined in the transition are distinguished by the spectral form and magnitude of their low-frequency fluctuations. This is argued to be a structural order-disorder transition. Raman spectroscopy shows the presence of clusters, confirming previous reports of their high density in the amorphous material, comparable to the crystalline phase. The possible role that these structural motifs play in the observed transport features is discussed.
Physics Subject Headings (PhySH)
Article Text
References (36)
- T. Bellini, M. Buscaglia, C. Chiccoli, F. Mantegazza,. P. Pasini, and C. Zannoni, Nematics with quenched disorder: What is left when long range order is disrupted? Phys. Rev. Lett. 85, 1008 (2000).
- M. D. Rechtin, A. L. Renninger, and B. L. Averbach, Monte-Carlo models of amorphous materials, J. Non-Cryst. Solids 15, 74 (1974).
- S. R. Elliott, Physics of Amorphous Materials, 2nd ed. (Longman, London, 1990).
- S. R. Elliott, The structure of amorphous materials, in Properties and Applications of Amorphous Materials, edited by M. F. Thorpe and L. Tichý, NATO Science Series, Vol. 9 (Springer, Dordrecht, 2001).
- M. A. Ramos, S. Vieira, F. J. Bermejo, J. Dawidowski, H. E. Fischer, H. Schober, M. A. González, C. K. Loong, and D. L. Price, Quantitative assessment of the effects of orientational and positional disorder on glassy dynamics, Phys. Rev. Lett. 78, 82 (1997).
- Z. H. Stachurskim, On structure and properties of amorphous materials, Materials 4, 1564 (2011).
- S. R. Elliott, Medium-range structural order in covalent amorphous solids, Nature (London) 354, 445 (1991).
- P. H. Gaskell, The structue of amorphous solids - A perspective view, J. Phys. Colloques 46, C8-3 (1985).
- M. D. Ediger, Vapor-deposited glasses provide clearer view of two-level systems, Proc. Natl. Acad. Sci. USA 111, 11232 (2014).
- Z. Ovadyahu, Slow dynamics of the electron-glasses; the role of disorder, Phys. Rev. B 95, 134203 (2017).
- A. Polian and M. Grimsditch, Room-temperature densification of a-Si versus pressure, Phys. Rev. B 41, 6086 (1990).
- S. Susman, K. J. Volin, D. L. Price, M. Grimsditch, J. P. Rino, R. K. Kalia, and P. Vashishta, G. Gwanmesia, Y. Wang, and R. C. Liebermann, Intermediate-range order in permanently densified vitreous: A neutron-diffraction and molecular-dynamics study, Phys. Rev. B 43, 1194 (1991).
- S. Onari, T. Inokuma, H. Kataura, and T. Arai, Absorption edge of the amorphous system under hydrostatic pressure, Phys. Rev. B 35, 4373 (1987).
- N. Ookubo, Y. Matsuda, and N. Kuroda, Hydrostatic pressure effects on the optical transitions in the free-standing porous silicon film, Appl. Phys. Lett. 63, 346 (1993).
- V. V. Brazhkin, E. Bychkov, and O. B. Tsiok, glass under high hydrostatic pressure: Polyamorphism, relaxation, and metallization, Phys. Rev. B 95, 054205 (2017).
- Z. Ovadyahu, Memory versus irreversibility in the thermal densification of amorphous glasses, Phys. Rev. B 95, 214207 (2017).
- C. Martinet, A Kassir-Bodon, T. Deschamps, A. Cornet, S. L. Floch, V. Martinez, and B. Champagnon, Permanently densified SiO2 glasses: A structural approach, J. Phys.: Condens. Matter 27, 325401 (2015).
- I. Zbeda, I. Bar, and Z. Ovadyahu, Microstructure and the boson peak in thermally treated films, Phys. Rev. Mater. 5, 085602 (2021).
- S. J. Poon and J. Durand, Critical phenomena and magnetic properties of an amorphous ferromagnet: Gadolinium-gold, Phys. Rev. B 16, 316 (1977).
- A. Das and A. K. Majumdar, Critical exponents of Cr-containing Co-rich metallic glasses, Phys. Rev. B 47, 5828 (1993).
- Z. Ovadyahu, Evolution of order in heat-treated amorphous GeSbTe, Phys. Rev. B 111, 104205 (2025).
- P. J. Cote and L. V. Meisel, Resistivity in amorphous and disordered crystalline alloys, Phys. Rev. Lett. 39, 102 (1977).
- K. S. Andrikopoulosa, S. N. Yannopoulosa, A. V. Kolobovc, P. Fonsd, and J. Tominaga, Raman scattering study of GeTe and phase-change materials, J. Phys. Chem. Solids 68, 1074 (2007).
- Z. Zhu, F. R. Liu, and Y. N. Huang, Raman study on the crystallization characteristics of amorphous film, Appl. Mech. Mater. 541-542, 229 (2014).
- R. Natarajan and S. Öǧüt, Structural and electronic properties of Ge-Te clusters, Phys. Rev. B 67, 235326 (2003).
- Equilibrium is used here in the spirit of: “All the fast things have happened, but the slow things have not yet” monitored by R(t).
- Yu. M. Galperin, V. L. Gurevich, and D. A. Parshin, Theory of low-temperature thermal expansion of glasses, Phys. Rev. B 32, 6873 (1985).
- J. Akola and R. O. Jones, Structural phase transitions on the nanoscale: The crucial pattern in the phase-change materials and GeTe, Phys. Rev. B 76, 235201 (2007).
- D. Liu, W. W. Lei, B. Zou, S. D. Yu, J. Hao, K. Wang, B. B. Liu, Q. L. Cui, a and G. T. Zou, High-pressure x-ray diffraction and Raman spectra study of indium oxide, J. App. Phys 104, 083506 (2008).
- P. W. Anderson, B. I. Halperin, and C. M. Varma, Anomalous low-temperature thermal properties of glasses and spin glasses, Philos. Mag. 25, 1 (1972).
- W. A. Phillips, Tunneling states in amorphous solids, J. Low Temp. Phys. 7, 351 (1972).
- R. F. Pettifer, R. Dupree, I. Farnan, and U. Sternberg, NMR determinations of Si-O-Si bond angle distributions in silica, J. Non-Cryst. Solids 106, 408 (1988).
- N. M. Zimmerman and W. H. Huber, Microscope of glassy relaxation in femtogram samples: Charge offset drift in the single electron transistor, Phys. Rev. B 80, 195304 (2009).
- D. R. Queen, X. Liu, J. Karel, T. H. Metcalf, and F. Hellman, Excess specific heat in evaporated amorphous silicon, Phys. Rev. Lett. 110, 135901 (2013).
- H. C. Jacks, M. Molina-Ruiz, M. H. Weber, J. J. Maldonis, P. M. Voyles, M. R. Abernathy, T. H. Metcalf, X. Liu, and F. Hellman, Structural tunability and origin of two-level systems in amorphous silicon, Phys. Rev. Mater. 6, 045604 (2022).
- M.-H. Kwon, B.-S. Lee, S. N. Bogle, L. N. Nittala, S. G. Bishop, J. R. Abelsona, S. Raoux, B.-K. Cheong, and K.-B. Kim, Nanometer-scale order in amorphous analyzed by fluctuation electron microscopy, Appl. Phys. Lett. 90, 021923 (2007).