- Physical Review Journals
All JournalsPhysics Magazine
Access Provided by Xinjiang University

Physical Review Applied

Export citation

Export citation

Choose format for download:

Download Citation
  • Access by Xinjiang University

Imprinting a Focused X-Ray Laser Beam to Measure Its Full Spatial Characteristics

J. Chalupský1,*, P. Boháček1, T. Burian1, V. Hájková1, S. P. Hau-Riege2, P. A. Heimann3, L. Juha1, M. Messerschmidt3, S. P. Moeller3 et al.

B. Nagler3, M. Rowen3, W. F. Schlotter3, M. L. Swiggers3, J. J. Turner3, and J. Krzywinski3

  • 1Institute of Physics, Academy of Sciences of the Czech Republic, Na Slovance 2, 182 21 Prague, Czech Republic
  • 2Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, California 94550, USA
  • 3SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025, USA

  • *Corresponding author. chal@fzu.cz
PDF

Phys. Rev. Applied 4, 014004 – Published 14 July, 2015

DOI: https://doi.org/10.1103/PhysRevApplied.4.014004

Abstract

The new generation of x-ray free-electron lasers opens up unique avenues for exploring matter under exotic and extreme conditions. Extensive spatial characterization of focused, typically (sub)micron-sized, laser beams is indispensable but, nevertheless, difficult to be accomplished due to excessive radiation intensities. Methods exist allowing indirect or semidirect focus characterization from a safe distance far from the focal point. Here we present a direct method of in-focus numerical phase recovery exploiting multishot desorption imprints in poly(methyl methacrylate). Shapes of the imprints serve as input data for the newly developed code PhaRe (phase recovery), inspired by the iterative Gerchberg-Saxton algorithm. A procedure of dynamic input-output mixing guarantees that the algorithm always converges to a self-consistent paraxial Helmholtz equation solution, which is thereafter optimized for transverse spatial coherence. Very good agreement with single-shot ablation imprints in lead tungstate (PbWO4) is found. The experiment is carried out at the Linac Coherent Light Source with a focused beam monochromatized at 800 eV. The results of the coherence optimization indicate that the act of monochromatization may have an effect on otherwise very good transverse coherence of free-electron laser beams.

View figure in article

Article Text

Multimedia

References (45)

  1. V. Ayvazyan et al., Generation of GW Radiation Pulses from a VUV Free-Electron Laser Operating in the Femtosecond Regime, Phys. Rev. Lett. 88, 104802 (2002).
  2. T. Shintake et al., A compact free-electron laser for generating coherent radiation in the extreme ultraviolet region, Nat. Photonics 2, 555 (2008).
  3. E. Allaria, C. Callegari, D. Cocco, W. M. Fawley, M. Kiskinova, C. Masciovecchio, and F. Parmigiani, The FERMI@Elettra free-electron-laser source for coherent x-ray physics: Photon properties, beam transport system and applications, New J. Phys. 12, 075002 (2009).
  4. P. Emma et al., First lasing and operation of an ångstrom-wavelength free-electron laser, Nat. Photonics 4, 641 (2010).
  5. T. Ishikawa et al., A compact x-ray free-electron laser emitting in the sub-ångström region, Nat. Photonics 6, 540 (2012).
  6. A. J. Nelson et al., Soft x-ray free electron laser microfocus for exploring matter under extreme conditions, Opt. Express 17, 18271 (2009).
  7. C. David, S. Gorelick, S. Rutishauser, J. Krzywinski, J. Vila-Comamala, V. A. Guzenko, O. Bunk, E. Farm, M. Ritala, M. Cammarata, D. M. Fritz, R. Barrett, L. Samoylova, J. Gruenert, and H. Sinn, Nanofocusing of hard x-ray free electron laser pulses using diamond based Fresnel zone plates, Sci. Rep. 1, 57 (2011).
  8. S. Le Pape, P. Zeitoun, M. Idir, P. Dhez, J. J. Rocca, and M. Francois, Electromagnetic-Field Distribution Measurements in the Soft X-Ray Range: Full Characterization of a Soft X-Ray Laser Beam, Phys. Rev. Lett. 88, 183901 (2002).
  9. B. Floeter, P. Juranic, S. Kapitzki, B. Keitel, K. Mann, E. Ploenjes, B. Schaefer, and K. Tiedtke, EUV Hartmann sensor for wavefront measurements at the Free-electron LASer in Hamburg, New J. Phys. 12, 083015 (2010).
  10. H. M. Quiney, A. G. Peele, Z. Cai, D. Paterson, and K. A. Nugent, Diffractive imaging of highly focused x-ray fields, Nat. Phys. 2, 101 (2006).
  11. H. Yumoto, H. Mimura, T. Koyama, S. Matsuyama, K. Tono, T. Togashi, Y. Inubushi, T. Sato, T. Tanaka, T. Kimura, H. Yokoyama, J. Kim, Y. Sano, Y. Hachisu, M. Yabashi, H. Ohashi, H. Ohmori, T. Ishikawa, and K. Yamauchi, Focusing of x-ray free-electron laser pulses with reflective optics, Nat. Photonics 7, 43 (2013).
  12. A. Schropp, R. Hoppe, V. Meier, J. Patommel, F. Seiboth, H. J. Lee, B. Nagler, E. C. Galtier, B. Arnold, U. Zastrau, J. B. Hastings, D. Nilsson, F. Uhlen, U. Vogt, H. M. Hertz, and C. G. Schroer, Full spatial characterization of a nanofocused x-ray free-electron laser beam by ptychographic imaging, Sci. Rep. 3, 1633 (2013).
  13. J. Chalupský et al., Characteristics of focused soft x-ray free-electron laser beam determined by ablation of organic molecular solids, Opt. Express 15, 6036 (2007).
  14. J. Chalupský, J. Krzywinski, L. Juha, V. Hájková, J. Cihelka, T. Burian, L. Vyšín, J. Gaudin, A. Gleeson, M. Jurek, A. R. Khorsand, D. Klinger, H. Wabnitz, R. Sobierajski, M. Störmer, K. Tiedtke, and S. Toleikis, Spot size characterization of focused non-Gaussian x-ray laser beams, Opt. Express 18, 27836 (2010).
  15. J. Chalupsky, P. Bohacek, V. Hajkova, S. P. Hau-Riege, P. A. Heimann, L. Juha, J. Krzywinski, M. Messerschmidt, S. P. Moeller, B. Nagler, M. Rowen, W. F. Schlotter, M. L. Swiggers, and J. J. Turner, Comparing different approaches to characterization of focused x-ray laser beams, Nucl. Instrum. Methods Phys. Res., Sect. A 631, 130 (2011).
  16. J. Chalupský, T. Burian, V. Hájková, L. Juha, T. Polcar, J. Gaudin, M. Nagasono, R. Sobierajski, M. Yabashi, and J. Krzywinski, Fluence scan: An unexplored property of a laser beam, Opt. Express 21, 26363 (2013).
  17. N. Gerasimova, S. Dziarzhytski, H. Weigelt, J. Chalupsky, V. Hajkova, L. Vysin, and L. Juha, In situ focus characterization by ablation technique to enable optics alignment at an XUV FEL source, Rev. Sci. Instrum. 84, 065104 (2013).
  18. B. Nagler et al., Turning solid aluminium transparent by intense soft X-ray photoionization, Nat. Phys. 5, 693 (2009).
  19. S. M. Vinko et al., Electronic Structure of an XUV Photogenerated Solid-Density Aluminum Plasma, Phys. Rev. Lett. 104, 225001 (2010).
  20. E. Galtier, F. B. Rosmej, T. Dzelzainis, D. Riley, F. Y. Khattak, P. Heimann, R. W. Lee, A. J. Nelson, S. M. Vinko, T. Whitcher, J. S. Wark, T. Tschentscher, S. Toleikis, R. R. Faeustlin, R. Sobierajski, M. Jurek, L. Juha, J. Chalupsky, V. Hajkova, M. Kozlova, J. Krzywinski, and B. Nagler, Decay of Crystalline Order and Equilibration during the Solid-to-Plasma Transition Induced by 20-fs Microfocused 92-eV Free-Electron-Laser Pulses, Phys. Rev. Lett. 106, 164801 (2011).
  21. S. M. Vinko et al., Creation and diagnosis of a solid-density plasma with an x-ray free-electron laser, Nature (London) 482, 59 (2012).
  22. O. Ciricosta et al., Direct Measurements of the Ionization Potential Depression in a Dense Plasma, Phys. Rev. Lett. 109, 065002 (2012).
  23. J. M. Liu, Simple technique for measurements of pulsed Gaussian-beam spot sizes, Opt. Lett. 7, 196 (1982).
  24. A. Aquila, C. Ozkan, R. Sobierajski, V. Hajkova, T. Burian, J. Chalupsky, L. Juha, M. Stoermer, H. Ohashi, T. Koyama, K. Tono, Y. Inubushi, M. Yabashi, H. Sinn, T. Tschentscher, A. P. Mancuso, and J. Gaudin, Results from single shot grazing incidence hard x-ray damage measurements conducted at the SACLA FEL, Proc. SPIE Int. Soc. Opt. Eng. 8777, 87770H (2013).
  25. L. Raimondi, C. Svetina, N. Mahne, D. Cocco, F. Capotondi, E. Pedersoli, M. Manfredda, M. Kiskinova, B. Keitel, G. Brenner, E. Ploenjes, T. Mey, K. Mann, and M. Zangrando, Status of the K-B bendable optics at FERMI@Elettra FEL, Proc. SPIE Int. Soc. Opt. Eng. 9208, 920804 (2014).
  26. A. F. G. Leontowich, A. Aquila, F. Stellato, R. Bean, H. Fleckenstein, M. Prasciolu, M. Liang, D. P. DePonte, A. Barty, F. Wang, J. Andreasson, J. Hajdu, H. N. Chapman, and S. Bajt, Characterizing the focus of a multilayer coated off-axis parabola for FLASH beam at lambda=4.3  nm, Proc. SPIE Int. Soc. Opt. Eng. 8777, 87770T (2013).
  27. A. Singer, F. Sorgenfrei, A. P. Mancuso, N. Gerasimova, O. M. Yefanov, J. Gulden, T. Gorniak, T. Senkbeil, A. Sakdinawat, Y. Liu, D. Attwood, S. Dziarzhytski, D. D. Mai, R. Treusch, E. Weckert, T. Salditt, A. Rosenhahn, W. Wurth, and I. A. Vartanyants, Spatial and temporal coherence properties of single free-electron laser pulses, Opt. Express 20, 17480 (2012).
  28. Y. Qin, T. Nakajima, H. Zen, X. Wang, T. Kii, and H. Ohgaki, Characterization of non-Gaussian mid-infrared free-electron laser beams by the knife-edge method, Infrared Phys. Technol. 66, 146 (2014).
  29. J. Chalupsky et al., Non-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses, Opt. Express 17, 208 (2009).
  30. S. Lindaas, H. Howells, C. Jacobsen, and A. Kalinovsky, X-ray holographic microscopy by means of photoresist recording and atomic-force microscope readout, J. Opt. Soc. Am. A 13, 1788 (1996).
  31. P. Heimann, O. Krupin, W. F. Schlotter, J. Turner, J. Krzywinski, F. Sorgenfrei, M. Messerschmidt, D. Bernstein, J. Chalupsky, V. Hajkova, S. P. Hau-Riege, M. Holmes, L. Juha, N. Kelez, J. Luening, D. Nordlund, M. F. Perea, A. Scherz, R. Soufli, W. Wurth, and M. Rowen, Linac Coherent Light Source soft x-ray materials science instrument optical design and monochromator commissioning, Rev. Sci. Instrum. 82, 093104 (2011).
  32. W. F. Schlotter et al., The soft x-ray instrument for materials studies at the linac coherent light source x-ray free-electron laser, Rev. Sci. Instrum. 83, 043107 (2012).
  33. K. Tiedtke et al., Absolute pulse energy measurements of soft x-rays at the Linac Coherent Light Source, Opt. Express 22, 21214 (2014).
  34. R. Soufli, M. Fernandez-Perea, S. L. Baker, J. C. Robinson, E. M. Gullikson, P. Heimann, V. V. Yashchuk, W. R. McKinney, W. F. Schlotter, and M. Rowen, Development and calibration of mirrors and gratings for the soft x-ray materials science beamline at the Linac Coherent Light Source free-electron laser, Appl. Opt. 51, 2118 (2012).
  35. R. W. Gerchberg and W. O. Saxton, Practical algorithm for determination of phase from image and diffraction plane pictures, Optik (Stuttgart) 35, 237 (1972).
  36. J. R. Fienup, Phase retrieval algorithms: A comparison, Appl. Opt. 21, 2758 (1982).
  37. H. H. Bauschke, P. L. Combettes, and D. R. Luke, Phase retrieval, error reduction algorithm, and Fienup variants: A view from convex optimization, J. Opt. Soc. Am. A 19, 1334 (2002).
  38. L. J. Allen, W. McBride, N. L. O’Leary, and M. P. Oxley, Exit wave reconstruction at atomic resolution, Ultramicroscopy 100, 91 (2004).
  39. A. C. Schell, A technique for determination of radiation pattern of a partially coherent aperture, IEEE Trans. Antennas Propag. 15, 187 (1967).
  40. L. Mandel and E. Wolf, Optical Coherence and Quantum Optics (Cambridge University Press, Cambridge, England, 1995).
  41. K. A. Nugent, Coherent methods in the x-ray sciences, Adv. Phys. 59, 1 (2010).
  42. G. Gbur and E. Wolf, The Rayleigh range of Gaussian Schell-model beams, J. Mod. Opt. 48, 1735 (2001).
  43. I. A. Vartanyants et al., Coherence Properties of Individual Femtosecond Pulses of an X-Ray Free-Electron Laser, Phys. Rev. Lett. 107, 144801 (2011).
  44. P. Paakkonen, J. Turunen, P. Vahimaa, A. T. Friberg, and F. Wyrowski, Partially coherent Gaussian pulses, Opt. Commun. 204, 53 (2002).
  45. I. A. Vartanyants and A. Singer, Coherence properties of hard x-ray synchrotron sources and x-ray free-electron lasers, New J. Phys. 12, 035004 (2010).

Outline

Information

Phys. Rev. Applied 4, 014004– Published 14 July, 2015
  • Received 9 October 2014
Article part of CHORUS

© 2015 American Physical Society

Sign In to Your Journals Account

Filter

Filter

Article Lookup

Enter a citation