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Tunnel Magnetoresistance and Spin-Transfer-Torque Switching in Polycrystalline Co2FeAl Full-Heusler-Alloy Magnetic Tunnel Junctions on Amorphous Si/SiO2 Substrates

Zhenchao Wen, Hiroaki Sukegawa, Shinya Kasai, Koichiro Inomata, and Seiji Mitani

  • National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba 305-0047, Japan

Phys. Rev. Applied 2, 024009 – Published 29 August, 2014

DOI: https://doi.org/10.1103/PhysRevApplied.2.024009

Abstract

We study polycrystalline B2-type Co2FeAl (CFA) full-Heusler-alloy-based magnetic tunnel junctions (MTJs) fabricated on a Si/SiO2 amorphous substrate. Polycrystalline CFA films with a (001) orientation, a high B2 ordering, and a flat surface are achieved by using a MgO buffer layer. A tunnel magnetoresistance ratio up to 175% is obtained for a MTJ with a CFA/MgO/CoFe structure on a 7.5-nm-thick MgO buffer. Spin-transfer-torque-induced magnetization switching is achieved in the MTJs with a 2-nm-thick polycrystalline CFA film as a switching layer. By using a thermal activation model, the intrinsic critical current density (Jc0) is determined to be 8.2×106A/cm2, which is lower than 2.9×107A/cm2, the value for epitaxial CFA MTJs [Appl. Phys. Lett. 100, 182403 (2012)]. We find that the Gilbert damping constant (α) evaluated by using ferromagnetic resonance measurements for the polycrystalline CFA film is approximately 0.015 and is almost independent of the CFA thickness (2–18 nm). The low Jc0 for the polycrystalline MTJ is mainly attributed to the low α of the CFA layer compared with the value in the epitaxial one (approximately 0.04).

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