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Single-Shot MeV Transmission Electron Microscopy with Picosecond Temporal Resolution

R. K. Li* and P. Musumeci

  • Department of Physics and Astronomy, UCLA, Los Angeles, California 90095, USA

  • *Present address: SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA.
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Phys. Rev. Applied 2, 024003 – Published 5 August, 2014

DOI: https://doi.org/10.1103/PhysRevApplied.2.024003

Abstract

Pushing the limits in temporal resolution for transmission electron microscopy (TEM) requires a revolutionary change in the electron source technology. In this paper, we study the possibility of employing a radio-frequency photoinjector as the electron source for a time-resolved TEM. By raising the beam energy to the relativistic regime, we minimize the space-charge effects which otherwise limit the spatiotemporal resolution of the instrument. Analysis and optimization of the system taking into account the achievable beam brightness, electron flux on the sample, chromatic and spherical aberration of the electron optic system, and space-charge effects in image formation are presented and supported by detailed numerical modeling. The results demonstrate the feasibility of 10-nm–10-ps spatiotemporal resolution single-shot MeV TEM.

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Synopsis

Quick Pictures with Electrons

Published 5 August, 2014

A relativistic electron source, similar to that used in x-ray lasers, is the key component in a new design for a high-speed electron microscope.

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Phys. Rev. Applied 2, 024003– Published 5 August, 2014
  • Received 13 May 2014
Article part of CHORUS

© 2014 American Physical Society

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