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Determining Interface Dielectric Losses in Superconducting Coplanar-Waveguide Resonators

W. Woods1,*,†, G. Calusine1,†, A. Melville1,†, A. Sevi1, E. Golden1, D.K. Kim1, D. Rosenberg1, J.L. Yoder1, and W.D. Oliver1,2,3

  • 1MIT Lincoln Laboratory, 244 Wood Street, Lexington, Massachusetts 02421, USA
  • 2Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
  • 3Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA

  • *wayne.woods@ll.mit.edu
  • †These authors contributed equally to this work.
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Phys. Rev. Applied 12, 014012 – Published 8 July, 2019

DOI: https://doi.org/10.1103/PhysRevApplied.12.014012

Abstract

Superconducting quantum-computing architectures comprise resonators and qubits that experience energy loss due to two-level systems (TLSs) in bulk and interfacial dielectrics. An understanding of these losses is critical to improving performance in superconducting circuits. In this work, we present a method for quantifying the TLS losses of different bulk and interfacial dielectrics present in superconducting coplanar-waveguide (CPW) resonators. By combining statistical characterization of sets of specifically designed CPW resonators on isotropically etched silicon substrates with detailed electromagnetic modeling, we determine the separate loss contributions from individual material interfaces and bulk dielectrics. This technique for analyzing interfacial TLS losses can be used to guide targeted improvements to qubits, resonators, and their superconducting fabrication processes.

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Phys. Rev. Applied 12, 014012– Published 8 July, 2019
  • Received 21 February 2019
Article part of CHORUS
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