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Measurement of the energy and power radiated by a pulsed blackbody x-ray source

H. C. Ives1, W. A. Stygar2, D. L. Fehl2, L. E. Ramirez3, S. C. Dropinski2, D. L. Wall4, J. S. Anctil4, J. S. McGurn2, J. H. Pyle3 et al.

D. L. Hanson2, B. N. Allison2, M. J. Berninger5, E. A. Bryce2, G. A. Chandler2, M. E. Cuneo2, A. J. Fox3, T. L. Gilliland3, C. L. Haslett3, R. J. Leeper2, D. F. Lewis6, M. A. Lucero2, M. G. Mazarakis2, D. H. McDaniel2, J. L. McKenney2, J. A. Mills2, L. P. Mix2, J. L. Porter2, M. B. Ritchey2, L. E. Ruggles2, J. F. Seamen2, W. W. Simpson2, R. B. Spielman2, J. A. Torres2, M. F. Vargas2, T. C. Wagoner3, L. K. Warne2, and M. W. York2

  • 1EG&G, Albuquerque, New Mexico 87107, USA
  • 2Sandia National Laboratories, Albuquerque, New Mexico 87185, USA
  • 3Ktech Corporation, Albuquerque, New Mexico 87123, USA
  • 4Resonetics Incorporated, Nashua, New Hampshire 03063, USA
  • 5Bechtel Nevada, Los Alamos, New Mexico 87544, USA
  • 6International Specialty Products, Wayne, New Jersey 07470, USA

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Phys. Rev. ST Accel. Beams 9, 110401 – Published 8 November, 2006

DOI: https://doi.org/10.1103/PhysRevSTAB.9.110401

Abstract

We have developed a diagnostic system that measures the spectrally integrated (i.e. the total) energy and power radiated by a pulsed blackbody x-ray source. The total-energy-and-power (TEP) diagnostic system is optimized for blackbody temperatures between 50 and 350 eV. The system can view apertured sources that radiate energies and powers as high as 2 MJ and 200 TW, respectively, and has been successfully tested at 0.84 MJ and 73 TW on the Z pulsed-power accelerator. The TEP system consists of two pinhole arrays, two silicon-diode detectors, and two thin-film nickel bolometers. Each of the two pinhole arrays is paired with a single silicon diode. Each array consists of a 38×38 square array of 10-μm-diameter pinholes in a 50-μm-thick tantalum plate. The arrays achromatically attenuate the x-ray flux by a factor of ∼1800. The use of such arrays for the attenuation of soft x rays was first proposed by Turner and co-workers [Rev. Sci. Instrum. 70, 656 (1999)]. The attenuated flux from each array illuminates its associated diode; the diode’s output current is recorded by a data-acquisition system with 0.6-ns time resolution. The arrays and diodes are located 19 and 24 m from the source, respectively. Because the diodes are designed to have an approximately flat spectral sensitivity, the output current from each diode is proportional to the x-ray power. The nickel bolometers are fielded at a slightly different angle from the array-diode combinations, and view (without pinhole attenuation) the same x-ray source. The bolometers measure the total x-ray energy radiated by the source and—on every shot—provide an in situ calibration of the array-diode combinations. Two array-diode pairs and two bolometers are fielded to reduce random uncertainties. An analytic model (which accounts for pinhole-diffraction effects) of the sensitivity of an array-diode combination is presented.

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Phys. Rev. ST Accel. Beams 9, 110401– Published 8 November, 2006
  • Received 10 May 2006
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