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Spin Readout of a CMOS Quantum Dot by Gate Reflectometry and Spin-Dependent Tunneling

Virginia N. Ciriano-Tejel1,2,*, Michael A. Fogarty1,2, Simon Schaal1,2, Louis Hutin3, Benoit Bertrand3, Lisa Ibberson4, M. Fernando Gonzalez-Zalba4,‡, Jing Li5, Yann-Michel Niquet5 et al.

Maud Vinet3 and John J.L. Morton1,2,6,†

  • 1London Centre for Nanotechnology, University College London, London WC1H 0AH, United Kingdom
  • 2Quantum Motion Technologies, Windsor House, Cornwall Road, Harrogate HG1 2PW, United Kingdom
  • 3CEA, LETI, Minatec Campus, F-38054 Grenoble, France
  • 4Hitachi Cambridge Laboratory, J.J. Thomson Avenue, Cambridge CB3 0HE, United Kingdom
  • 5Université Grenoble Alpes, CEA, IRIG-MEM-L_Sim, F-38000 Grenoble, France
  • 6Department of Electronic and Electrical Engineering, UCL, London WC1E 7JE, United Kingdom

  • *virginia.ciriano.17@ucl.ac.uk
  • jjl.morton@ucl.ac.uk
  • Present address: Quantum Motion Technologies, Windsor House, Cornwall Road, Harrogate, HG1 2PW, United Kingdom.

PRX Quantum 2, 010353 – Published 31 March, 2021

DOI: https://doi.org/10.1103/PRXQuantum.2.010353

Abstract

Silicon spin qubits are promising candidates for realizing large-scale quantum processors, benefitting from a magnetically quiet host material and the prospects of leveraging the mature silicon device fabrication industry. We report the measurement of an electron spin in a singly occupied gate-defined quantum dot, fabricated using CMOS-compatible processes at the 300-mm wafer scale. For readout, we employ spin-dependent tunneling combined with a low-footprint single-lead quantum-dot charge sensor, measured using rf gate reflectometry. We demonstrate spin readout in two devices using this technique, obtaining valley splittings in the range 0.5–0.7 meV using excited-state spectroscopy, and measure a maximum electron-spin relaxation time (T1) of 9±3 s at 1 T. These long lifetimes indicate the silicon-nanowire geometry and fabrication processes employed here show a great deal of promise for qubit devices, while the spin-readout method demonstrated here is well suited to a variety of scalable architectures.

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