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Ground State of Impurity Atoms in Semiconductors Having Anisotropic Energy Surfaces

Murray A. Lampert

  • RCA Laboratories, David Sarnoff Research Center, Princeton, New Jersey

Phys. Rev. 97, 352 – Published 15 January, 1955

DOI: https://doi.org/10.1103/PhysRev.97.352

Abstract

The nature of the ground state of a substitutional impurity atom in a crystal having an anisotropic energy-band structure is re-examined. A variational calculation has been made for the case of a band whose energy contours consist of several, symmetrically-located ellipsoids. Unlike the previous scalar, hydrogenic impurity model, this calculation at the outset uses the experimentally determined effective-mass-tensor components. Results for the impurity binding energy in germanium and silicon are on the order of thirty percent lower than those obtained directly from activation-slope measurements. Further, theoretical agreement with the experimentally determined critical impurity density for vanishing binding energy in germanium is much improved over the older model, though still not perfect.

References (5)

  1. H. C. Torrey and C. A. Witmer's Crystal Rectifiers (McGraw-Hill Book Company, Inc., New York, 1948) G. W. Castellan and F. Seitz in Semiconducting Materials (Proceedings of the Reading Conference) (Academic Press, New York, 1951)
  2. Lax, Zeiger, Dexter, and Rosenblum, Phys. Rev. 93, 1418 (1954) B. Lax, paper read at the Amsterdam Conference on Semiconductors, June 1954, Physica (to be published)
  3. G. F. Koster and J. C. Slater, Phys. Rev. 95, 1167 (1954)
  4. J. Luttinger (private communication)
  5. P. P. Debye and E. M. Conwell, Phys. Rev. 93, 705 (1954)

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