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Electrical Conduction and Recrystallization in Thin Pb Films Deposited at Low Temperatures

Edgar L. Armi*

  • Cryogenic Laboratory, Norman Bridge Laboratory of Physics, California Institute of Technology, Pasadena, California

  • *Now at the Department of Physics, Alabama Polytechnic Institute, Auburn, Alabama.

Phys. Rev. 63, 451 – Published 1 June, 1943

DOI: https://doi.org/10.1103/PhysRev.63.451

Abstract

By evaporation in high vacuum, thin Pb films were deposited on glass plates cooled by liquid hydrogen. Beginning of electrical conduction was observed in films of a nominal thickness of 7A. Aging of these films at various temperatures revealed the existence of two regions of different behavior; decrease of resistance below and increase of resistance above an equilibrium temperature. Possible explanations are offered.

References (7)

  1. A. B. C. Anderson, Thesis C.I.T. (1933) A. B. C. Anderson and A. Goetz, Phys. Rev. 45, 293 (1934)
  2. M. G. Foster, Phys. Rev. 57, 42 (1940) Thesis C.I.T. (1939)
  3. Omitted endnote

  4. M. C. Johnson and T. V. Starkey, Proc. Roy. Soc. 40, 126 (1933)
  5. R. Suhrmann and W. Berndt, Zeits. f. Physik 115, 17 (1940)
  6. A. H. Weber and D. F. O'Brien, Phys. Rev. 60, 574 (1941)
  7. E. L. Armi, Thesis, June 1941, California Institute of Technology

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