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Shapes and Wavelengths of K Series Lines of Elements Ti 22 to Ge 32

J. A. Bearden and C. H. Shaw*

  • Rowland Physical Laboratory, Johns Hopkins University

  • *National Research Fellow, Cornell University.

Phys. Rev. 48, 18 – Published 1 July, 1935

DOI: https://doi.org/10.1103/PhysRev.48.18

Abstract

A double crystal spectrometer was used to measure the widths at half-maximum and the indices of asymmetry of the principle K series lines of the elements Ti 22 to Ge 32. When sufficient intensity was available, measurements were made in three orders of diffraction, namely, in the (1-2), (1+1) and (1+2) positions. Curves of width vs. atomic number and degree of asymmetry vs. atomic number are different in the various orders. These differences are discussed. Measurements were also made of the widths of certain satellites and of their intensities and displacements relative to an adjacent line. The diffraction angles of the peaks of the lines were determined with precision in two orders and wavelengths calculated. Comparisons are made with single crystal photographic spectrometer work and the higher degree of accuracy obtained in the present work is pointed out.

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