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Theory of the Double X-Ray Spectrometer

M. M. Schwarzschild

  • Columbia University

Phys. Rev. 32, 162 – Published 1 August, 1928

DOI: https://doi.org/10.1103/PhysRev.32.162

Abstract

The geometric factors in the construction and use of the double x-ray spectrometer are examined in detail. It is found that the resolution of the instrument is not affected by the width of the slits but that, on the other hand, the height of the slits must be limited to preserve resolution. A formula is given for the limiting value of the ratio— average height of effective slits: distance between effective slits—for any particular width of observed line, in order that the width observed be the result principally of the physical factors. The physical factors, namely, crystal imperfection, line width, diffuseness of absorption limits, are also discussed and formulas are derived by means of which the experimental curves found with the instrument may be interpreted physically.

References (11)

  1. Omitted endnote

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  4. Davis and Slack, Phys. Rev. 27, 18 (1926)
  5. Davis and Purks, Proc. Nat. Acad. Sci. 13, 419 (1927)
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