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Some Comment on the Photo-Magneto-Electric Effect in Silicon
Phys. Rev. 149, 663 – Published 16 September, 1966Erratum Phys. Rev. 156, 1038 (1967)
DOI: https://doi.org/10.1103/PhysRev.149.663
Abstract
Some measurements by Mette and Boatright of the photo-magneto-electric (PME) open-circuit voltage at 25°C in Si have been reanalyzed on the basis of a simple photodissociation model. Good agreement between the predictions of the model and the data is obtained. The main results are expressed by the proportionality , where is the magnetic induction, is the excess photon energy above a threshold (found to be 1.08 eV), and is the photon flux density. is also predicted to be proportional to , where is the Gibbs function associated with a postulated barrier to recombination of electrons and holes. Data were not available to check this latter prediction and future experiments are suggested. An implication of the model is that the PME effect is due to photons which are absorbed within a distance less than the recombination length from the electrodes.
Erratum
Some Comments on the Photomagnetoelectric Effect in Silicon
References (4)
- H. L. Mette and A. Boatright, Phys. Rev. 140, A919 (1965)
- R. E. Barker, Jr. and C. R. Thomas, J. Appl. Phys. 35, 3202 (1964)
- J. H. Schulman and W. D. Compton, Color Centers in Solids (The Macmillan Company, New York, 1962), p. 313
- N. C. MacDonald and T. E. Everhart, Appl. Phys. Letters 7, 267 (1966)