High-Frequency Thermometry

Marvin Chester

doi:10.1103/PhysRev.145.76

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High-Frequency Thermometry

Marvin Chester

Department of Physics, University of California, Los Angeles, California

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Phys. Rev. 145, 76 – Published 6 May, 1966

DOI: https://doi.org/10.1103/PhysRev.145.76

Abstract

Recent advances in the technology of fast-response thermal detectors and their application to the measurement of short-time thermal transport effects have made it expedient to make some theoretical estimates with which the experimental results may be compared. A dispersion relationship between the applied frequency of thermal oscillation and its associated wave vector is therefore derived. This relationship, besides involving the diffusion constant of the medium through which the thermal transport is proceeding, depends on three new parameters—two characteristic times and a characteristic length. Formulas are presented for these parameters in terms of the appropriate averages over the phonon energy spectrum of the microscopic interaction rates which govern the transport. Hence, from measurements of the thermal dispersion and the parameters which govern it, further information on these microscopic rates can be deduced.

References (16)

A. N. Golovashkin and G. P. Motulevich, Cryogenics 3, 167 (1963)
F. B. Hagedorn, Phys. Rev. Letters 12, 322 (1964)
R. J. von Gutfeld and A. H. Nethercot, Jr., Phys. Rev. Letters 12, 641 (1964)
M. Chester, Phys. Rev. 131, 2013 (1963)
J. A. Sussmann and A. Thellung, Proc. Phys. Soc. (London) 81, 1722 (1963)
E. W. Prohofsky and J. A. Krumhansl, Phys. Rev. 133, 1403 (1964)
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C. J. Glassbrenner and G. A. Slack, Phys. Rev. 134, A1058 (1964)
C. T. Walker and R. O. Pohl, Phys. Rev. 131, 1433 (1963)
M. G. Holland, Phys. Rev. 132, 2461 (1963)
J. Callaway, Phys. Rev. 122, 787 (1961)
J. Callaway and H. C. von Baeyer, Phys. Rev. 120, 1149 (1960)
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P. Erdös, Phys. Rev. 138, A1200 (1965)
F. Reif, Statistical and Thermal Physics (McGraw-Hill Book Company, Inc., New York, 1965), Chap. 14.4

[c1] A. N. Golovashkin and G. P. Motulevich, Cryogenics 3, 167 (1963)

[c2] F. B. Hagedorn, Phys. Rev. Letters 12, 322 (1964)

[c3] R. J. von Gutfeld and A. H. Nethercot, Jr., Phys. Rev. Letters 12, 641 (1964)

[c4] M. Chester, Phys. Rev. 131, 2013 (1963)

[c5] J. A. Sussmann and A. Thellung, Proc. Phys. Soc. (London) 81, 1722 (1963)

[c6] E. W. Prohofsky and J. A. Krumhansl, Phys. Rev. 133, 1403 (1964)

[c7] R. A. Guyer and J. A. Krumhansl, Phys. Rev. 133, 1411 (1964)

[c8] C. J. Glassbrenner and G. A. Slack, Phys. Rev. 134, A1058 (1964)

[c9] C. T. Walker and R. O. Pohl, Phys. Rev. 131, 1433 (1963)

[c10] M. G. Holland, Phys. Rev. 132, 2461 (1963)

[c11] J. Callaway, Phys. Rev. 122, 787 (1961)

[c12] J. Callaway and H. C. von Baeyer, Phys. Rev. 120, 1149 (1960)

[c13] P. Carruthers, Rev. Mod. Phys. 33, 92 (1961)

[c14] J. Callaway, Phys. Rev. 113, 1046 (1959)

[c15] P. Erdös, Phys. Rev. 138, A1200 (1965)

[c16] F. Reif, Statistical and Thermal Physics (McGraw-Hill Book Company, Inc., New York, 1965), Chap. 14.4

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High-Frequency Thermometry

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