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Electron Spin-Lattice Relaxation at Defect Sites; E Centers in Synthetic Quartz at 3 Kilo-Oersteds

J. G. Castle, Jr., D. W. Feldman, and P. G. Klemens

R. A. Weeks*

  • Westinghouse Research Laboratories, Pittsburgh, Pennsylvania

  • Oak Ridge National Laboratory, Oak Ridge, Tennessee

  • *Oak Ridge National Laboratory is operated by Union Carbide Corporation for the U. S. Atomic Energy Commission.

Phys. Rev. 130, 577 – Published 15 April, 1963

DOI: https://doi.org/10.1103/PhysRev.130.577

Abstract

Measurements of the spin-lattice relaxation time T1 by the inversion-recovery technique are reported for two paramagnetic centers in quartz over a wide temperature range: from 1.3 to 250°K for the E1 center, and from 2 to 80°K the E2 center. The data, extending over several orders of magnitude in T1, are interpreted in terms of cross relaxation, direct processes, and Raman processes. The dominant feature of the Raman relaxation is a temperature variation of about T3, which is much slower than expected by standard theory.

The theory of spin-lattice relaxation is extended to account for the modification at a defect site of the strain due to a lattice wave. Each defect has at least one characteristic frequency and the local strain due to a wave of higher frequency is enhanced, being essentially given by the displacement due to the wave, rather than its spatial derivative. If the characteristic frequency is sufficiently low compared to the Debye frequency, the Raman relaxation rate should vary as T3 (or T5) over a wide range of temperatures, instead of the usual T7 (or T9) variation.

A detailed comparison of the relaxation rates observed for the two E centers with the above theory suggests that each center has two characteristic frequencies or temperatures θi. For the E2 center one of these (θi=45°K) is ascribed to the vibration of a neighboring impurity ion, probably a proton. The other temperature (≃5°K) may arise from the motion of oxygen ions at the defect. The E1 center has the two characteristic temperatures of 140°K and 14°K.

A model for the E1 center is proposed: An electron is trapped at a silicon ion located in an oxygen divacancy. This model leads to the likelihood of low characteristic frequencies through a non-rigid SiO2 group, and also through a net negative charge, which should attract one or more interstitial impurity ions.

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