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Detection of Double Resonance by Frequency Change: Application to Hg201

Robert H. Kohler*

  • Department of Physics and Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts

  • *Present address, Columbia Radiation Laboratory, Physics Department, Columbia University, New York.

Phys. Rev. 121, 1104 – Published 15 February, 1961

DOI: https://doi.org/10.1103/PhysRev.121.1104

Abstract

A new type of double-resonance experiment that depends on wavelength effects rather than on polarization effects is discussed. Incident polarized light is replaced by incident light of wavelength coincident with just one component of the structure to be measured. The analyzer is replaced by a cell of gas that absorbs just that same component and lets the others pass. Magnetic resonance from the excited component to one of the others is monitored by increases in the light transmitted through the absorbing gas. This experiment requires that the Doppler width be smaller than the structure. This method was first applied to measure the hyperfine structure of the P13 state of Hg201. The incident light and absorbing gas were both supplied by separated Hg198, whose resonance line coincides naturally with one component of the Hg201 hyperfine structure. Measurement of Hg201 is discussed in detail. The following hfs intervals were found: f(1232)=7551.613±0.013 Mc/sec and f(3252)=13986.557±0.008 Mc/sec. The magnetic dipole and electric dipole interaction constants, calculated without quadratic hfs corrections, are a=5454.569±0.003 Mc/sec, b=280.107±0.005 Mc/sec.

Means for applying the method when there is no isotope coincidence are given. This new method is compared with the polarization technique and is found to give signal-to-noise ratios that are orders of magnitude higher.

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