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  • Access by Xinjiang University

Study of 1f Noise in Semiconductor Filaments

Leon Bess*

  • Lincoln Laboratory, Massachusetts Institute of Technology, Lexington, Massachusetts

  • *Now at Philco Corporation, Tioga and C Street; Philadelphia, Pennsylvania.

Phys. Rev. 103, 72 – Published 1 July, 1956

DOI: https://doi.org/10.1103/PhysRev.103.72

Abstract

A theory is devised for the generation of 1f noise in semiconductor filaments, involving the diffusion of impurity atoms along the surface of the sample and along edge dislocations within the bulk. A set of six experiments is described which tends to corroborate this theory.

References (21)

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  5. Omitted endnote

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  18. Omitted endnote

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